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2005, vol.8, no.1	2005, vol.8, no.10	2005, vol.8, no.11	2005, vol.8, no.12	2005, vol.8, no.2	2005, vol.8, no.3
2005, vol.8, no.4	2005, vol.8, no.5	2005, vol.8, no.6	2005, vol.8, no.7-8	2005, vol.8, no.9

题名	作者	出版年	年卷期
Pushing the limits of SPM	Joost W. M. Frenken; Tjerk H. Oosterkamp; Bas L. M. Hendriksen; Marcel J. Rost	2005	2005, vol.8, no.5
Fast-scanning STM studies	Flemming Besenbacher; Erik Laegsgaard; Ivan Stensgaard	2005	2005, vol.8, no.5
AFM's path to atomic resolution	Franz J. Giessibl	2005	2005, vol.8, no.5
Friction force microscopy	Roland Bennewitz	2005	2005, vol.8, no.5
Near-field Raman microscopy	Neil Anderson; Achim Hartschuh; Lukas Novotny	2005	2005, vol.8, no.5