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期刊


ISSN0946-7076
刊名Microsystem technologies
参考译名微系统技术：传感器，致动器与系统集成
收藏年代1998～2024

关联期刊参考译名收藏年代
Journal of Information Storage and Processing Systems存储与处理系统信息杂志2000～2001


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1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2024, vol.30, no.1 2024, vol.30, no.2 2024, vol.30, no.3 2024, vol.30, no.4 2024, vol.30, no.5 2024, vol.30, no.6
2024, vol.30, no.7

题名作者出版年年卷期
Design and performance analysis of charge plasma TFET for biosensor applications: a simulation studyManaswi, D.; Karumuri, Srinivas Rao20242024, vol.30, no.6
RF and linearity parameters analysis of 20 nm gate-all-around gate-stacked junction-less accumulation mode MOSFET for low power circuit applicationsKumar, Jitender; Mahajan, Aparna N.; Deswal, S. S.; Saxena, Amit; Gupta, R. S.20242024, vol.30, no.6
Power quality enhancement of microgrid using fuzzy logic controlled inverter and SFCLDhara, Saumen; Shrivastav, Alok Kumar; Sadhu, Pradip Kumar20242024, vol.30, no.6
Design of wide stopband lowpass filter using defected ground structureRao, K. Srinivasa; Vali, S. K. Shoukat20242024, vol.30, no.6
Design of a detachable bronchoscope for endotracheal intubationKohanfars, Matthew; Laha, Avinash; Li, Yu M.; Morris, Karcher; Ahadian, Farshad; Talke, Frank E.20242024, vol.30, no.6
Development of a gravity compensation device for rotary joint using magnetic energyZhu, Weizheng; Shan, Leimeng; Lee, Kyung-min20242024, vol.30, no.6
Optimal design and implement of a droplet generator of droplet digital polymerase chain reaction via taguchi methodTu, Tse-Yi; Lee, Tung-Yu; Lee, Yung-Pin20242024, vol.30, no.6
A low power static noise margin enhanced reliable 8 T SRAM cellKumar, Appikatla Phani; Lorenzo, Rohit20242024, vol.30, no.6
Design and analysis of dual gate MOSFET with spacer engineeringPraveen, K.; Vijay, D. Sai; Subramanyam, Y.; Karthik, T.; Reddy, V. Satvik; Sravani, K. Girija20242024, vol.30, no.6
Optimal design of wafer back-grinding feeding profile considering subsurface damage and productivityKim, Byeong-Geon; Hwang, Byunghyun; Park, Kyoung-Su20242024, vol.30, no.6



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